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Secondary electron flight times and tracks in the carbon foil time pick-up detector

机译:碳箔时间拾取探测器中的二次电子飞行时间和轨迹

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摘要

Carbon foil time pick-up detectors used in the time-of-flight measurements of MeV energy ions have been studied in connection to time-of-flight-energy spectrometer used for heavy ion elastic recoil detection analysis. In experimental coincident TOF-E data characteristic halos are observed around light element isobars, and the origin of these halos were studied. The experimental data indicated that these halos originate from single electron events occurring before the electron multiplication in the microchannel plate. By means of electron trajectory simulations, this halo effect is explained to originate from single electron, emitted from the carbon foil, hitting the non-active area of the microchannel plate. This electron creates a secondary electron from the surface and which ends up to the microchannel plate pore, is multiplied and create now a detectable signal. Other general timing gate parameters such as wire-to-wire spacing of the grids, acceleration potential of the 1st grid and the mirror grid potential gradient were also studied in order to improve the detector performance.
机译:在MeV能量离子的飞行时间测量中使用的碳箔时间拾取检测器已与用于重离子弹性反冲检测分析的飞行时间能量光谱仪结合进行了研究。在实验重合的TOF-E数据中,在轻元素等压线周围观察到了特征光晕,并研究了这些光晕的起源。实验数据表明,这些光晕源自在微通道板中电子倍增之前发生的单个电子事件。通过电子轨迹模拟,这种晕圈效应被解释为源自碳箔发出的单个电子撞击微通道板的非活性区域。该电子从表面产生二次电子,该二次电子最终到达微通道板孔,被倍增,现在产生可检测的信号。为了提高检测器性能,还研究了其他通用的时序门参数,例如栅格的线对线间距,第一栅格的加速电势和镜像栅格的电势梯度。

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